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Showing results: 1006 - 1020 of 1638 items found.

  • HPGL Plotter Emulator software

    Plottergeist - Aphena Ltd

    Plottergeist "the phantom plotter" emulates all the common HPGL plotters. It runs on a standard PC equipped with a GPIB card or using RS-232, and connects to test equipment or another computer. The software behaves like a real plotter, with the exception that the PC screen is the paper.

  • Bus Analyzer

    FireSpy422bT/822bT - DapTechnology B.V.

    The FireSpy422bT and FireSpy822bT bus analyzers are DapTechnology's latest single-bus IEEE-1394 protocol analyzers. Based on the 4th generation FireSpy analyzer architecture the FireSpy422bT/822bT is the most advanced 1394 test equipment in the market. They comprises a significantly more powerful on-board processor and improved connectivity to the host.

  • Circuit Breaker Analyzer

    CBA 1000 - Altanova Group

    CBA 1000 circuit breaker timing test equipment is a reliable and very accurate operating device for the maintenance and commissioning of circuit breakers in medium and high voltage substation. It can perform static and dynamic contact resistance measurement and it’s an accurate timing speed and motion analyzer.

  • Power and Energy Automated Calibration System

    RS-933 - Radian Research, Inc.

    The RS-933 Syntron Power and Energy Automated Calibration System calibrates a range of test equipment including; Energy Reference Standards, Digital Multimeters, Phase meters, Energy meters, Power meters, Revenue meters, Amp meters, Panel meters & Power Quality meters.

  • Network Simulation and Load Testing

    EXFO Inc.

    EXFO offers a complete range of high-performance test solutions, covering the entire converged network from RAN to IMS. By mimicking real-world customer behavior in lab environments, our solutions allow mobile operators and equipment manufacturers to verify their wireless networks before deployment.

  • Horizontal Calibration Instruments (Lab)

    THV - Trimos sa

    The horizontal THV instrument has been designed for calibration and certification of gauging equipment of small dimension. It allows easy and precise checking of plug gauges, ring gauges, thread plug gauges, test and dial indicators as well as measuring of high precision production parts.

  • SpaceWire Monitors

    4Links Ltd.

    This section details the 4Links range of high-performance test equipment that is used to monitor SpaceWire networks. These devices are attached to your SpaceWire systems and then can be accessed via Gigabit Ethernet, using the standard TCP/IP family of protocols, so that they can be controlled remotely (for instance, by partners collaborating on a mission).

  • High and Low Temperature & Low Pressure Chamber

    LAP-100 - Lisun Electronics Inc.

    It is according to GB10590 / GB15091 low temperature / low pressure test chamber requirements; GB11159 low pressure test chamber requirements; GB / T2423. 25-1992 low temperature / low pressure integrated chamber requirement; GB / T2423. 26-1992 High temperature / low pressure integrated chamber requirement; GJB150. 2-86 low temperature / low pressure test etc standards. It’s used to test the In aviation, aerospace, information, electronics and other fields, to determine the instrumentation, Electrical products, materials, components, equipment etc.

  • Adjustable Press Plate Bed of Nails Testers

    Prober Adjustable Family - Test Electronics

    Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.

  • Edge Press Technology Bed of Nails Testers

    Prober Edge Press Family - Test Electronics

    Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.

  • Press Down Rods Bed of Nails Testers

    Prober Press Rods Family - Test Electronics

    Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.

  • Gauge R&R ANOVA

    yieldWerx Semiconductor

    Gauge R&R provides an analysis technique for engineers to determine the amount of variability caused by a measurement system. For semiconductor devices to ensure that specifications can be guaranteed the repeatability and reproducibility of measurements need to be small relative to the measured specification tolerances.  Primarily product and test engineers use this to assess test equipment.  Yet with advanced design-for-test (DFT) based test methods which rely upon on-die circuitry to take a parametric measurement, design engineers should perform a Gauge R & R analysis to understand their on-die measurement variability.

  • Electric Vehicle Test Solution

    Chroma ATE Inc.

    As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.

  • Switching Power Supply ATS (SMPS ATS)

    8200 - Chroma ATE Inc.

    Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.

  • Probing & Analysis Adapters

    Ironwood Electronics

    No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.

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